Constantinos Xanthopoulos

Data Scientist · Austin, TX ·

Problem-solving through Machine Learning, Statistical Analysis, Data Mining and Visualization

About

I have a strong acumen for problem-solving and enjoy the challenge that complex problems bring. Data science allows me to combine both my software engineering and research technologies to develop efficient solutions for achieving project goals. I am currently working in the field of semiconductor manufacturing, solving automation, test-cost reduction, and test quality challenges through machine learning, but my interests span across many domains.

I hold a bachelor's in Computer Science and a Master's and Ph.D. in Computer Engineering. I am experienced in working with complex datasets and have expertise in a wide range of data science and software engineering tools and technologies. I enjoy automating repetitive and menial tasks to help machine learning operations and software engineering teams focus on the tasks that improve the product and deliver on company goals.

Outside of work, I spend my time expanding my knowledge of technology, 3D printing projects, tinkering with electronics, baking, and cooking.

My Technology Stack

The following is a somewhat preference-sorted list of some of the technologies I currently like and use in professional and personal projects.

Data Science & Machine Learning
  • Python
  • Pandas
  • Numpy
  • Scikit-learn
  • Plotly
  • Matplotlib
  • Tensorflow
  • PyTorch
  • Keras
  • R
Deployment & CI/CD
  • FastAPI
  • Jenkins
  • Docker
  • Kubernetes
  • Packer
  • Terraform
  • AWS
  • Google Cloud
Databases
  • MySQL
  • MongoDB
  • Redis
  • SQLite
IDEs & Editors
  • VS Code
  • Jupyter
  • Vim
Authoring & Documentation
  • Markdown
  • LaTeX
Version Control
  • Git
  • GitHub
  • GitLab
  • Bitbucket
Web Development
  • Hugo
  • Svelte
Linux Environment
  • Debian
  • Ubuntu
  • Bash
Other
  • Raspberry Pi
  • Photoshop
  • Illustrator

Publications

Book Chapters
  • Editors: A. Elfadel, D. Bonning and X. Li, Chapter Authors: C. Xanthopoulos, K. Huang, A. Ahmadi, N. Kupp, J. Carulli, A. Nahar, B. Orr, M. Pass, Y. Makris "Machine Learning in VLSI Computer-Aided Design: Gaussian Process-Based Wafer-Level Correlation Modeling and its Applications," Springer, 2018
Journal Articles
  • K. Huang, N. Kupp, C. Xanthopoulos, J. M. Carulli Jr., Y. Makris "Low-Cost Analog/RF IC Testing through Combined Intra- and Inter-Die Correlation Models," Special Issue on Speeding up Analog Integration and Test for Mixed-signal SOCs of the IEEE Design & Test of Computers (D&T), 2015
  • G. Rajavendra Reddy, C. Xanthopoulos, Y. Makris "On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement," Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2019
Conference Papers
  • C. Xanthopoulos, K. Huang, A. Poonawala, A. Nahar, B. Orr, J. Carulli, Y. Makris "IC Laser Trimming Speed-Up through Wafer-level Spatial Correlation Modeling," Proceedings of the IEEE International Test Conference (ITC), 2014
  • A. Ahmadi, C. Xanthopoulos, A. Nahar, B. Orr, M. Pas, Y. Makris "Harnessing Process Variations for Optimizing Wafer-Level Probe-Test Flow," Proceedings of the IEEE International Test Conference (ITC), 2016
  • C. Xanthopoulos, A. Ahmadi, S. Boddikurapati, A. Nahar, B. Orr, Y. Makris "Wafer-Level Adaptive Trim Seed Forecasting," Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS), 2017
  • C. Xanthopoulos, P. Sarson, H Reiter, Y. Makris "Automated Die Inking: A Pattern Recognition-Based Approach," Proceedings of the IEEE International Test Conference (ITC), 2017
  • G. Rajavendra Reddy, C. Xanthopoulos, Y. Makris "Enhanced Hotspot Detection Through Synthetic Pattern Generation and Design of Experiments," Proceedings of the IEEE VLSI Test Symposium (VTS), 2018
  • C. Xanthopoulos, D. Neethirajan, S. Boddikurapati, A, Nahar, Y. Makris "Wafer-Level Adaptive Vmin Calibration Seed Forecasting," Proceedings of the IEEE Design Automation and Test in Europe (DATE), 2019
  • D. Neethirajan, C. Xanthopoulos, K. Subramani, K. Schaub, I. Leventhal, Y. Makris "Machine Learning-based Noise Classification and Decomposition in RF Transceivers," Proceedings of the IEEE VLSI Test Symposium (VTS), 2019
  • C. Xanthopoulos, A. Neckermann, P. List, K-P. Tschernay, P. Sarson, Y. Makris "Automated Die Inking through On-line Machine Learning," Proceedings of the IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019
  • N. Agrawal, M-J. Yang, C. Xanthopoulos, V. Thangamariappan, J. Xiao, C-W. Ho, K. Schaub, I. Leventhal "Automated Socket Anomaly Detection through Deep Learning," Proceedings of the IEEE International Test Conference (ITC), 2020
  • V. Niranjan, D. Neethirajan, C. Xanthopoulos, E. De La Rosa, C. Alleyne, S. Mier, Y. Makris "Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation," Proceedings of the IEEE VLSI Test Symposium (VTS), 2021